Interface hole-doping in cuprate-titanate superlattices
N.Pavlenko, I.Elfimov, T.Kopp, and G.A.Sawatzky

TL;DR
This study uses LSDA+U calculations to show that interface polarity in cuprate-titanate superlattices causes hole doping in CuO$_2$ layers, influencing superconductivity in engineered devices.
Contribution
It reveals the mechanism of interface hole doping due to polarity effects in cuprate-titanate heterostructures, impacting superconducting properties.
Findings
Metallic state with hole carriers in CuO$_2$ and interface TiO$_2$, SrO planes.
Interface polarity causes effective doping of CuO$_2$ layers.
Pre-doping influences superconducting behavior in superlattice devices.
Abstract
The electronic structure of interfaces between YBaCuO and SrTiO is studied using local spin density approximation (LSDA) with intra-atomic Coulomb repulsion (LSDA+U). We find a metallic state in cuprate/titanate heterostructures with the hole carriers concentrated substantially in the CuO-layers and in the first interface TiO and SrO planes. This effective interface doping appears due to the polarity of interfaces, caused by the first incomplete copper oxide unit cell. Interface-induced high pre-doping of CuO-layers is a key mechanism controlling the superconducting properties in engineered field-effect devices realized on the basis of cuprate/titanate superlattices.
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