Transmission electron microscopy investigation of segregation and critical floating-layer content of indium for island formation in InGaAs
D. Litvinov, D. Gerthsen, A. Rosenauer, M. Schowalter, T. Passow, P., Feinaeugle, and M. Hetterich

TL;DR
This study uses transmission electron microscopy and photoluminescence spectroscopy to analyze indium segregation and island formation in InGaAs layers grown by molecular-beam epitaxy, revealing the critical indium floating-layer content and segregation behavior.
Contribution
It provides detailed insights into indium segregation profiles, the transition between growth modes, and the temperature dependence of segregation efficiency in InGaAs layers.
Findings
Transition from 2D to 3D growth occurs when In-floating layer exceeds ~1.1 monolayers.
In-floating layer is not consumed during island formation.
Segregation efficiency increases with growth temperature from 0.65 to 0.83.
Abstract
We have investigated InGaAs layers grown by molecular-beam epitaxy on GaAs(001) by transmission electron microscopy (TEM) and photoluminescence spectroscopy. InGaAs layers with In-concentrations of 16, 25 and 28 % and respective thicknesses of 20, 22 and 23 monolayers were deposited at 535 C. The parameters were chosen to grow layers slightly above and below the transition between the two- and three-dimensional growth mode. In-concentration profiles were obtained from high-resolution TEM images by composition evaluation by lattice fringe analysis. The measured profiles can be well described applying the segregation model of Muraki et al. [Appl. Phys. Lett. 61 (1992) 557]. Calculated photoluminescence peak positions on the basis of the measured concentration profiles are in good agreement with the experimental ones. Evaluating experimental In-concentration profiles it is found that the…
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