Electronically coupled complementary interfaces between perovskite band insulators
M. Huijben, G. Rijnders, D.H.A. Blank, S. Bals, S. Van Aert, J., Verbeeck, G. Van Tendeloo, A. Brinkman, H. Hilgenkamp

TL;DR
This study demonstrates the fabrication of electronically coupled LaAlO3/SrTiO3 interfaces with controlled spacing, revealing critical separation distances affecting conductivity while maintaining high carrier mobility, advancing oxide electronic device design.
Contribution
It reports the first realization of coupled complementary oxide interfaces with atomic-scale control, elucidating the effects of interface spacing on electronic properties.
Findings
Critical separation distance of 6 perovskite layers affects conductivity.
High carrier mobility is preserved at sub-nanometer interface spacing.
Decreased carrier density occurs below the critical separation.
Abstract
Perovskite oxides exhibit a plethora of exceptional electronic properties, providing the basis for novel concepts of oxide-electronic devices. The interest in these materials is even extended by the remarkable characteristics of their interfaces. Studies on single epitaxial connections between the two wide-bandgap insulators LaAlO3 and SrTiO3 have revealed them to be either high-mobility electron conductors or insulating, depending on the atomic stacking sequences. In the latter case they are conceivably positively charged. For device applications, as well as for basic understanding of the interface conduction mechanism, it is important to investigate the electronic coupling of closely-spaced complementary interfaces. Here we report the successful realization of such electronically coupled complementary interfaces in SrTiO3 - LaAlO3 thin film multilayer structures, in which the atomic…
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Magnetic and transport properties of perovskites and related materials · Semiconductor materials and devices
