Phase field modeling of wetting on structured surfaces
Kaifu Luo, Mikko-Pekka Kuittu, Chaohui Tong, Sami Majaniemi, Tapio, Ala-Nissila

TL;DR
This paper uses phase-field modeling to analyze how contact lines behave on structured surfaces with stripe defects, revealing how defect size influences contact line distortion and shape, with results aligning with experimental observations.
Contribution
It introduces a phase-field model to study contact line dynamics on striped defects, providing both numerical and analytical insights into defect size effects.
Findings
Contact line distortion depends on defect width
Maximum distortion saturates for wide defects
Numerical results agree with experimental data
Abstract
We study the dynamics and equilibrium profile shapes of contact lines for wetting in the case of a spatially inhomogeneous solid wall with stripe defects. Using a phase-field model with conserved dynamics, we first numerically determine the contact line behavior in the case of a stripe defect of varying width. For narrow defects, we find that the maximum distortion of the contact line and the healing length are related to the defect width, while for wide defects, they saturate to constant values. This behavior is in quantitative agreement with experimental data. In addition, we examine the shape of the contact line between two stripe defects as a function of their separation. Using the phase-field model, we also analytically estimate the contact line configuration, and find good qualitative agreement with the numerical results.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
