Comment on ``Four-Point Resistance of Individual Single-Wall Carbon Nanotubes'' by Gao et al. PRL 95, 196208 (2005)

TL;DR

This paper critically discusses the physical interpretation of intrinsic device resistance in single-wall carbon nanotubes, highlighting subtle points often overlooked in previous studies.

Contribution

It provides a detailed commentary clarifying the physical meaning of intrinsic resistance in nanotube devices, addressing ambiguities in prior work.

Findings

Highlights the importance of careful interpretation of resistance measurements

Clarifies the physical meaning of intrinsic device resistance

Addresses subtle points in resistance measurement techniques

Abstract

We remark on some delicate points that attend the physical meaning of intrinsic device resistance.