Microstructural studies on lattice imperfections in irradiated Titanium and Ti-5%Ta-2%Nb by X-Ray Diffraction Line Profile Analysis

TL;DR

This study investigates how irradiation affects the microstructure of titanium and Ti-5%Ta-2%Nb, revealing decreases in domain size and increases in dislocation density, with negligible changes in stacking fault probabilities.

Contribution

It provides a detailed analysis of irradiation-induced microstructural changes in titanium alloys using X-Ray Diffraction Line Profile Analysis, highlighting the effects on domain size and dislocation density.

Findings

Average domain size decreases with irradiation dose

Dislocation density increases significantly and saturates at higher doses

Stacking fault probabilities remain negligible despite irradiation

Abstract

The microstructural parameters like the average domain size, effective domain size at a particular crystallographic direction and microstrain within the domains of titanium and Ti-5%Ta-2%Nb, irradiated with 116 MeV O5+ ion, have been characterized as a function of dose by X-Ray Diffraction Line Profile Analysis using different model based approaches. Dislocation Density and stacking fault probabilities have also been estimated from the analysis. The analysis revealed that there was a significant decrease of the average domain size with dose as compared to the unirradiated sample. The estimated values of dislocation density increased significantly for the irradiated samples and was found to be an order of magnitude more as compared to the unirradiated one. However, the dislocation density saturated with increase in dose. The deformation (stacking) fault probabilities were found to be negligible even with the increase in dose of irradiation.