Dynamics of Josephson junctions and single-flux-quantum networks with superconductor-insulator-normal metal junction shunts
A.B. Zorin, E.M. Tolkacheva, M.I. Khabipov, F.-I. Buchholz, J., Niemeyer

TL;DR
This paper models Josephson junctions with SIN junction shunts, revealing how their impedance affects circuit dynamics, damping, and capacitance, and demonstrating their operation in flux-quanta circuits.
Contribution
It introduces a microscopic model for SIN-shunted Josephson junctions, highlighting their unique impedance effects and validating their use in flux-quanta circuits.
Findings
SIN impedance causes frequency-dependent damping and reactance.
Effective capacitance of the circuit increases due to SIN impedance.
Basic flux-quanta circuits operate correctly with SIN-shunted junctions.
Abstract
Within the framework of the microscopic model of tunneling, we modelled the behavior of the Josephson junction shunted by the Superconductor-Insulator-Normal metal (SIN) tunnel junction. We found that the electromagnetic impedance of the SIN junction yields both the frequency-dependent damping and dynamic reactance which leads to an increase in the effective capacitance of the circuit. We calculated the dc I-V curves and transient characteristics of these circuits and explained their quantitative differences to the curves obtained within the resistively shunted junction model. The correct operation of the basic single-flux-quanta circuits with such SIN-shunted junctions, i.e. the Josephson transmission line and the toggle flip-flop, have also been modelled.
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