Laser Scanning Microscopy of HTS Films and Devices

TL;DR

This paper reviews and demonstrates the use of Laser Scanning Microscopy (LSM) for high-temperature superconductor (HTS) materials, showcasing novel applications like rf response imaging and phase slip line visualization.

Contribution

It introduces new applications of LSM in HTS research, including imaging in rf mode and probing superconducting properties, and confirms the phase slip line mechanism via LSM imaging.

Findings

LSM can image HTS responses in rf mode

Phase slip lines mechanism in HTS confirmed by LSM

Development of two-beam laser scanning microscopy

Abstract

The work describes the capabilities of Laser Scanning Microscopy (LSM) as a spatially resolved method of testing high_Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of twobeam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.