Electrical transport in deformed nanostrips: electrical signature of reversible mechanical failure

TL;DR

This study investigates how electrical conductivity in a nanostrip changes under tensile deformation, revealing a reversible phase transition that could be used for sensitive strain detection.

Contribution

It introduces a model linking mechanical deformation to electrical signatures in nanostrips, highlighting a reversible phase transition with potential sensor applications.

Findings

Conductivity exhibits anomalous behavior under tensile strain.

Failure involves nucleation of solid and smectic-like phases.

Conductivity jump correlates with reversible mechanical failure.

Abstract

We calculate the electrical conductivity of a thin crystalline strip of atoms confined within a quasi one dimensional channel of fixed width. The conductivity shows anomalous behavior as the strip is deformed under tensile loading. Beyond a critical strain, the solid fails by the nucleation of alternating bands of solid and {\em smectic} like phases accompanied by a jump in the conductivity. Since the failure of the strip in this system is known to be reversible, the onductivity anomaly may have practical use as a sensitive strain transducer.