X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

TL;DR

This paper demonstrates how x-ray scattering at lanthanide M5 resonances can be used to analyze magnetic structures in thin films, providing high sensitivity and depth profiling capabilities for complex magnetic materials.

Contribution

It introduces a method to quantify magnetic scattering lengths and optical constants at M5 resonances, enabling detailed magnetic depth profiling.

Findings

Magnetic scattering lengths up to 200 r_0 were measured.

First- and second-order magnetic satellites observed.

Method applied to profile helical antiferromagnetic domains.

Abstract

Quantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M_5 resonances result in values of the optical constants and the magnetic scattering lengths f_m, with f_m as large as 200 r_0. The observation of first- and second-order magnetic satellites allows to separate f_m into circular and linear dichroic contributions. This high magnetic sensitivity, in conjunction with the tunable x-ray probing depth across the resonance can be applied to monitor depth profiles of complex magnetic structures, as e.g. of helical antiferromagnetic domains in a Dy metal film.