Enhancement of the critical slowing down influenced by extended defects
V. Blavatska, M. Dudka, R. Folk, Yu. Holovatch

TL;DR
This paper investigates how extended, quenched defects affect the critical slowing down in three-dimensional systems with non-conserved order parameters, providing numerical estimates for critical exponents.
Contribution
It introduces a model considering correlated extended defects and calculates critical exponents for the divergence of relaxation time based on defect dimensionality and order parameter components.
Findings
Critical exponents depend on defect correlation dimension and order parameter components.
Numerical values for critical exponents are provided for various defect configurations.
Extended defects significantly influence the dynamics near criticality.
Abstract
We study an influence of the quenched extended defects on the critical dynamics of the d=3-dimensional systems with m-component non-conserved order parameter (model A dynamics). Considering defects to be correlated in \epsilon_d dimensions and randomly distributed in d-\epsilon_d dimensions we obtain reliable numerical values for the critical exponents governing divergence of the relaxation time as function of m and \epsilon_d.
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Taxonomy
TopicsTheoretical and Computational Physics · Stochastic processes and statistical mechanics · Markov Chains and Monte Carlo Methods
