Effect of Native Defects on Optical Properties of InxGa1-xN Alloys
S. X. Li, E.E. Haller, K. M. Yu, W. Walukiewicz, J. W. Ager III, J., Wu, W. Shan, Hai Lu, and William J. Schaff

TL;DR
This study investigates how high-energy helium ion irradiation modifies the optical absorption edge and carrier populations in InxGa1-xN alloys, revealing defect-induced effects consistent with the amphoteric defect model.
Contribution
It demonstrates the controlled tuning of optical and electronic properties of InxGa1-xN alloys through irradiation-induced native defects, aligning experimental results with defect model predictions.
Findings
Blue shift of absorption edge in In-rich alloys due to band-filling effect.
Introduction of native defects inside the bandgap acting as acceptors in Ga-rich alloys.
Changes in optical properties are consistent with the amphoteric defect model.
Abstract
The energy position of the optical absorption edge and the free carrier populations in InxGa1-xN ternary alloys can be controlled using high energy 4He+ irradiation. The blue shift of the absorption edge after irradiation in In-rich material (x > 0.34) is attributed to the band-filling effect (Burstein-Moss shift) due to the native donors introduced by the irradiation. In Ga-rich material, optical absorption measurements show that the irradiation-introduced native defects are inside the bandgap, where they are incorporated as acceptors. The observed irradiation-produced changes in the optical absorption edge and the carrier populations in InxGa1-xN are in excellent agreement with the predictions of the amphoteric defect model.
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