Quantum size effects on the perpendicular upper critical field in ultra-thin lead films
Xin-Yu Bao, Yan-Feng Zhang, Yupeng Wang, Jin-Feng Jia, Qi-Kun Xue, X., C. Xie, Zhong-Xian Zhao

TL;DR
This study investigates how quantum size effects influence the oscillations of the perpendicular upper critical field in ultra-thin lead films, revealing significant oscillatory behavior linked to film thickness and mean free path variations.
Contribution
It demonstrates the thickness-dependent oscillations of $H_{c2ot}$ and resistivity in ultra-thin lead films, highlighting the role of quantum size effects in these phenomena.
Findings
Oscillations of $H_{c2ot}$ depend on film thickness.
Resistivity also shows oscillatory behavior with thickness.
Quantum size effects modulate the mean free path affecting $H_{c2ot}$.
Abstract
We report the thickness-dependent (in terms of atomic layers) oscillation behavior of the perpendicular upper critical field in the ultra-thin lead films at the reduced temperature (). Distinct oscillations of the normal-state resistivity as a function of film thickness have also been observed. Compared with the oscillation, the shows a considerable large oscillation amplitude and a phase shift. The oscillatory mean free path caused by quantum size effect plays a role in oscillation.
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