Controlled single electron transfer between Si:P dots

TL;DR

This paper demonstrates electrical control of silicon phosphorus double quantum dots with nanoscale precision, enabling single electron transfer detection, which advances silicon-based quantum computing components.

Contribution

It introduces a method to control and detect single electron transfer in phosphorus-doped silicon double dots with nanoscale dimensions.

Findings

Electron transfer observed with differential bias

Single electron transistors used as charge detectors

Potential for scaling to single-atom dots

Abstract

We demonstrate electrical control of Si:P double dots in which the potential is defined by nanoscale phosphorus doped regions. Each dot contains approximately 600 phosphorus atoms and has a diameter close to 30 nm. On application of a differential bias across the dots, electron transfer is observed, using single electron transistors in both dc- and rf-mode as charge detectors. With the possibility to scale the dots down to few and even single atoms these results open the way to a new class of precision-doped quantum dots in silicon.