Characterization of E'delta and triplet point defects in oxygen deficient amorphous silicon dioxide
G. Buscarino, S. Agnello, F. M. Gelardi

TL;DR
This study uses electron paramagnetic resonance to analyze gamma ray induced point defects in oxygen deficient amorphous silicon dioxide, revealing defect behaviors, charge transfer processes, and the hyperfine structure of specific centers.
Contribution
It provides new insights into the nature, origin, and thermal behavior of E'gamma, E'delta, and triplet defects, including their charge states and hyperfine interactions.
Findings
E'gamma, E'delta, and triplet defects are induced by gamma irradiation.
E'gamma and E'delta centers increase with temperature after irradiation.
The 10 mT doublet is confirmed as the hyperfine structure of the E'delta center.
Abstract
We report an experimental study by electron paramagnetic resonance (EPR) of gamma ray irradiation induced point defects in oxygen deficient amorphous SiO2 materials. We have found that three intrinsic (E'gamma, E'delta and triplet) and one extrinsic ([AlO4]0) paramagnetic centers are induced. All the paramagnetic defects but E'gamma center are found to reach a concentration limit value for doses above 10^3 kGy, suggesting a generation process from precursors. Isochronal thermal treatments of a sample irradiated at 10^3 kGy have shown that for T>500 K the concentrations of E'gamma and E'delta centers increase concomitantly to the decrease of [AlO4]0. This occurrence speaks for an hole transfer process from [AlO4]0 centers to diamagnetic precursors of E' centers proving the positive charge state of the thermally induced E'gamma and E'delta centers and giving insight on the origin of…
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