Tunnel junction as a noise probe

TL;DR

This paper theoretically explores how different types of noise influence the low-bias current-voltage characteristics of tunnel junctions, proposing their use as sensitive noise probes in various electronic environments.

Contribution

It introduces a theoretical framework linking shot and phase noise effects to the asymmetry and sensitivity of tunnel junction IV curves, extending to normal and superconducting junctions.

Findings

Shot noise causes asymmetry in IV curves of Josephson junctions.

High-current shot noise reveals electron tunneling statistics.

Phase noise impacts IV characteristics, enabling noise analysis.

Abstract

The paper investigates theoretically effects of noise on low-bias parts of $IV$ curves of tunnel junctions. The analysis starts from the effect of shot noise from an additional (noise) junction on the Coulomb blockaded Josephson junction in high-impedance environment. Asymmetry of shot noise characterized by its odd moments results in asymmetry of the $IV$ curve of the Josephson junction. At high currents through the noise junction the $IV$ curve is very sensitive to electron counting statistics. The theory is generalized on another type of noise (phase noise of a monochromatic AC input), on a normal Coulomb blockaded tunnel junction. The effect of shot noise on the $IV$ curve of a superconducting Josephson junction in low-impedance environment is also analyzed. From this effect one can obtain information on the time necessary for an electron to tunnel through the junction responsible for shot noise. In summary, the analysis demonstrates, that the low-bias part of the $IV$ curves of tunnel junctions can be a sensitive probe of various types of noise.