Space Charge Limited Current Revisited: the Effect of Surface Traps

TL;DR

This paper investigates how surface traps significantly alter space charge limited current behavior, providing a more accurate model that aligns with experimental data compared to traditional bulk-only trap theories.

Contribution

It introduces a revised analysis incorporating surface traps into space charge limited current models, improving the understanding of experimental observations.

Findings

Surface traps profoundly affect I-V characteristics.

Revised models match experimental data better.

Surface traps are crucial in device behavior understanding.

Abstract

We analyze the effect of surface traps on unipolar space charge limited current and find that they have a profound influence on the $I-V$ curves. By performing calculations that account for the presence of these traps, we can reproduce experimental observations not captured by the conventional theory that only considers the presence of traps in the bulk of the material. Through the use of realistic material parameters, we show that the effects discussed have clear experimental relevance.