Microstructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering

TL;DR

This study uses x-ray diffuse scattering to analyze the microstructural and morphological features of homoepitaxial (001)ZnTe layers, revealing stacking faults and surface morphology characteristics.

Contribution

It provides detailed insights into the microstructure and surface morphology of ZnTe layers using advanced x-ray diffuse scattering techniques.

Findings

Identification of stacking faults via diffuse scattering streaks

Correlation between diffuse scattering features and layer morphology

Distinct diffuse scattering patterns related to microstructural defects

Abstract

The microstructural and morphological properties of homoepitaxial (001)ZnTe layers are investigated by x-ray diffuse scattering. High resolution reciprocal space maps recorded close to the ZnTe (004) Bragg peak show different diffuse scattering features. One kind of cross-shaped diffuse scattering streaks along <111> directions can be attributed to stacking faults within the epilayers. Another kind of cross-shaped streaks inclined at an angle of about 80deg with respect to the <110> in-plane direction arises from the morphology of the epilayers. (abridged version)