Simulations of Time-Resolved X-Ray Diffraction in Laue Geometry

TL;DR

This paper introduces a computer simulation method for Time-Resolved X-ray Diffraction in Laue geometry, modeling strain effects from laser irradiation with validation against experimental data.

Contribution

It presents a novel simulation approach for TRXD in Laue geometry, incorporating complex strain generation mechanisms and comparing results with experiments.

Findings

Simulation accurately models strain dynamics in Laue geometry

Numerical model includes effects like electron-hole diffusion and thermal diffusion

Results align well with recent experimental observations

Abstract

A method of computer simulation of Time-Resolved X-ray Diffraction (TRXD) in asymmetric Laue (transmission) geometry with an arbitrary propagating strain perpendicular to the crystal surface is presented. We present two case studies for possible strain generation by short-pulse laser irradiation: (i) a thermoelastic-like analytic model; (ii) a numerical model including effects of electron-hole diffusion, Auger recombination, deformation potential and thermal diffusion. A comparison with recent experimental results is also presented.