Full counting-statistics in a single-electron transistor in the presence of nonequilibrium quantum fluctuations of charge

TL;DR

This paper investigates how nonequilibrium quantum charge fluctuations affect current statistics in a single-electron transistor, revealing that lifetime broadening can suppress large current probabilities.

Contribution

It introduces a novel theoretical approach combining Schwinger-Keldysh and Majorana fermion methods to analyze full counting statistics under quantum fluctuations.

Findings

Lifetime broadening suppresses large current probabilities.

Quantum fluctuations induce parameter renormalization.

The approach provides detailed current distribution insights.

Abstract

Using the Schwinger-Keldysh approach and the drone (Majorana) fermion representation, we evaluate current distribution in a single-electron transistor in a regime where a total tunnel resistance is small. Nonequilibrium quantum fluctuations of charge induce a lifetime broadening of charge-state level, as well as renormalization of system parameters. We find that the lifetime broadening effect may suppress the probability of relatively large current.