A New Type 'Magnetic-field' Probe of High Spatial-resolution Based on a Single-layer Flat-coil Method

TL;DR

This paper introduces a novel magnetic-field probe using a single-layer flat coil, enabling high-resolution, non-perturbing surface microscopy with potential for new microscopy techniques.

Contribution

It presents a new type of magnetic-field probe based on a single-layer flat coil, replacing traditional near-field probes for high-resolution surface imaging.

Findings

Proposes a highly sensitive RF test method for surface probing.

Enables non-perturbing long-range surface measurements.

Lays groundwork for a new generation of microscopy techniques.

Abstract

A radically new approach to surface probing based on a replacement of the solid-state near-field probes by the 'long-field' ones is presented and discussed. Such probes may enable to create a radically new generation microscopes with non-perturbing long-range action probe based on a highly sensitive RF test method with a single-layer flat coil. This may give a start for creation of a new direction in microscopy.