The Conductance of a Perfect Thin Film with Diffuse Surface Scattering
Gerd Bergmann
TL;DR
This paper presents a diffraction-based approach to calculating the conductance of perfect thin films with diffuse surface scattering, resolving divergence issues in classical models when the electron mean free path is very large or infinite.
Contribution
It introduces a simple diffraction picture that provides a finite conductance limit for thin films with diffuse surface scattering, addressing divergence in previous semi-classical solutions.
Findings
Diffraction approach yields finite conductance for infinite mean free path
The model aligns with classical results at finite mean free paths
Provides a new perspective on electron transport in thin films
Abstract
The conductance of thin films with diffusive surface scattering was solved semi-classically by Fuchs and Sondheimer. However, when the intrinsic electron mean free path is very large or infinite their conductance diverges. In this letter a simple diffraction picture is presented. It yields a conductance which corresponds to a limiting mean free path. PACS: 73.50.-h, 73.50.Bk, 73.23.-b, 73.25.+i, B146
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