Critical indices of random planar electrical networks
J.S. Espinoza Ortiz, Gemunu H. Gunaratne

TL;DR
This paper introduces a novel method to estimate the critical index of random planar electrical networks' strength, validated through finite size scaling and analysis of various damage modalities affecting nonlinear strength reduction.
Contribution
A new approach for estimating the critical index in random electrical networks, incorporating yield strength expressions and damage modality analysis.
Findings
Validated the new estimation method with finite size scaling.
Analyzed the impact of different damage modalities on network strength.
Provided insights into nonlinear strength reduction behaviors.
Abstract
We propose a new method to estimate the critical index for strength of networks of random fused conductors. It relies on a recently introduced expression for their yield strength. We confirm the results using finite size scaling. To pursue this commitment, we systematically study different damage modalities of conducting networks inducing variations on the behavior of their nonlinear strength reduction.
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Taxonomy
TopicsCellular Automata and Applications · Interconnection Networks and Systems · VLSI and FPGA Design Techniques
