Temperature Dependence of Piezoelectric and Electrostrictive Properties in a PBN:65 Morphotropic Phase Boundary Thin Film

TL;DR

This study investigates how the piezoelectric and electrostrictive properties of a PBN:65 MPB thin film vary with temperature, revealing abnormal strain behavior and minimal hysteresis at specific temperatures.

Contribution

It provides the first detailed temperature-dependent analysis of piezoelectric and electrostrictive constants in PBN:65 MPB thin films using optical reflection methods.

Findings

Abnormal strain behavior observed at 275 K.

Minimal hysteresis of time constant at 275 K.

Temperature-dependent piezoelectric and electrostrictive constants measured.

Abstract

We used an optical reflection method to measure the temperature-dependence of the piezoelectricity, electrostriction and time constant of a morphotropic phase boundary (MPB) thin film. We obtained the piezoelectric constant and the electrostrictive constant as a function of temperature by curve fitting the experimental data. We also obtained the time constant as a function of temperature and applied voltage. An abnormal behavior of the strain that was larger at 275 K than at 285 K was observed. This observation was also consistent with the minimal hysteresis behavior of the time constant at 275 K. We provided a possible explanation for this observation.