Low frequency conductance fluctuations (1/f^\alpha noise) in 15nm Ag nanowires: Implication on its stability

TL;DR

This study investigates low frequency resistance fluctuations in 15nm to 200nm silver nanowires across a wide temperature range, revealing a size-dependent excess noise likely caused by Rayleigh-Plateau instability, impacting nanowire stability.

Contribution

It identifies a size-dependent excess 1/f^{3/2} noise in ultra-thin nanowires and links it to Rayleigh-Plateau instability, providing insights into nanowire stability mechanisms.

Findings

Excess low frequency noise peaks beyond a certain temperature.

Significant 1/f^{3/2} noise observed in 15nm wires.

Noise diminishes rapidly with increasing wire diameter.

Abstract

We have measured the low frequency (1mHz<f<10Hz) resistance fluctuations in metallic nanowires (diameter 15nm to 200nm) in the temperature range 77K to 400K. The nanowires were grown electrochemically in polycarbonate membranes and the measurements were carried out in arrays of nanowires by retaining them in the membrane. A large fluctuation in excess of conventional 1/f noise which peaks beyond a certain temperature was found. The fluctuations with a significant low frequency component (~1/f^{3/2}) arise when the diameter of the wire ~15nm and vanishes rapidly as the diameter is increased. We argue that Rayleigh-Plateau instability is the likely cause of this excess noise.