Fabrication and Electric Field Dependent Transport Measurements of Mesoscopic Graphite Devices
Yuanbo Zhang, Joshua P. Small, William V. Pontius, and Philip Kim

TL;DR
This paper introduces a micromechanical method to extract thin graphite samples and investigates their electric field-dependent conductance, revealing significant gate voltage modulation and boundary scattering effects in mesoscopic devices.
Contribution
The study presents a novel micromechanical technique for preparing ultra-thin graphite samples and explores their transport properties under electric fields.
Findings
Strong conductance modulation with gate voltage in thin samples
Increased boundary scattering in thinner graphite devices
Temperature-dependent resistivity indicates boundary effects
Abstract
We have developed a unique micromechanical method to extract extremely thin graphite samples. Graphite crystallites with thicknesses ranging from 10 - 100 nm and lateral size 2 m are extracted from bulk. Mesoscopic graphite devices are fabricated from these samples for electric field dependent conductance measurements. Strong conductance modulation as a function of gate voltage is observed in the thinner crystallite devices. The temperature dependent resistivity measurements show more boundary scattering contribution in the thinner graphite samples.
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