Ultrathin Organic Transistors on Oxide Surfaces

TL;DR

This paper investigates ultrathin organic transistors on oxide surfaces, focusing on the role of the organic/oxide interface in carrier transport and device performance through experimental and modeling approaches.

Contribution

It introduces a model of ultrathin organic transistors emphasizing interface effects, supported by transport measurements and structural analysis.

Findings

Interface morphology influences carrier mobility.

Equilibrium between free and trapped carriers affects performance.

A simple 2D model explains device characteristics.

Abstract

In recent years, thin-film organic field-effect transistors (OFETs) have begun to be considered as a possible alternative to the hydrogenated amorphous silicon thin-film transistors (a-Si:H TFT's) used in active matrix flat panel displays and other large-area electronics applications. Low-temperature processability, low-cost fabrication and compatibility with arbitrary substrates are some of the promising advantages of OFETs, among others. Of the many organic materials available, pentacene, in particular, is one of the leading candidates for use in current thin-film OFET architectures - this because of its excellent electrical characteristics and its resistance to atmospheric oxygen. In the recent literature, pentacene's transport properties, as well as transistor performance, have already been analyzed from the point of view of substrate treatments, pentacene evaporation rate and substrate temperature, electrode chemical nature and channel geometry. The results show that the morphology, crystal structure and molecular ordering of the first organic monolayer(s) at the pentacene/dielectric interface are essential determinants of carrier transport phenomena. To further investigate these interface effects, we have built a model organic field-effect transistor which consists essentially of a single layer of pentacene on an oxide substrate. Four-probe and two-probe transport measurements as a function of temperature and fields will be presented in relation with structural near-field observations. The experimental results suggest a simple two-dimensional model where the equilibrium between free and trapped carriers at the oxide interface determines the OFET characteristics and performance.