Optimal static and dynamic recycling of defective binary devices

TL;DR

This paper analyzes the binary Defect Combination Problem using statistical mechanics, identifying conditions for fully working subsets and proposing a dynamic recycling method to eliminate wastage of imperfect components.

Contribution

It introduces a statistical mechanics framework to characterize the defect combination problem and proposes a dynamic recycling approach for zero wastage.

Findings

Identifies parameter regions with high probability of fully working subsets.

Provides a statistical mechanics analysis of the defect combination problem.

Demonstrates that dynamic recycling can achieve zero wastage.

Abstract

The binary Defect Combination Problem consists in finding a fully working subset from a given ensemble of imperfect binary components. We determine the typical properties of the model using methods of statistical mechanics, in particular, the region in the parameter space where there is almost surely at least one fully-working subset. Dynamic recycling of a flux of imperfect binary components leads to zero wastage.