Reflectivity measurements in uniaxial superconductors: a methodological discussion applied to the case of La(2-x)Sr(x)CuO(4)

TL;DR

This paper discusses the challenges in measuring the in-plane reflectivity of uniaxial superconductors, focusing on La$_{2-x}$Sr$_x$CuO$_{4+y}$, and provides methodological insights to improve data accuracy.

Contribution

It offers a quantitative analysis of experimental issues like c-axis contamination and data extrapolation in infrared reflectivity measurements of uniaxial superconductors.

Findings

Identifies key experimental challenges in reflectivity measurements.

Provides methods to mitigate c-axis contamination effects.

Analyzes extrapolation techniques for low-frequency data.

Abstract

Most of the novel superconductors are uniaxial crystals, with metallic planes ($ab$) orthogonal to an insulating axis ($c$). Far-infrared measurements of the reflectivity $R_{ab} (\omega)$ provide valuable information on their low-energy electrodynamics, but involve delicate experimental issues. Two of them are a possible contamination of $R_{ab} (\omega)$ from the c axis and the extrapolation of the $R_{ab}$ data to $\omega$ =0, both above and below $T_c$. Here we discuss quantitatively these issues with particular regard to La$_{2-x}$Sr$_x$CuO$_{4+y}$, one of the most studied high-$T_c$ materials.