Numerical study of discrete models in the class of the nonlinear molecular beam epitaxy equation
Fabio D A Aarao Reis

TL;DR
This study numerically investigates discrete growth models within the nonlinear molecular beam epitaxy (VLDS) class, providing refined estimates of scaling exponents and exploring universality of height distribution ratios across different models and dimensions.
Contribution
It offers the most accurate estimates of scaling exponents for CRSOS models in 1D, confirms higher order corrections in VLDS theory, and demonstrates universality of amplitude ratios in the VLDS class.
Findings
CRSOS model in 1D yields alpha=0.94±0.02, z=2.88±0.04.
In 2D, roughness exponent alpha approximates 2/3, matching one-loop predictions.
Amplitude ratios S and Q are universal across models in the VLDS class.
Abstract
We study numerically some discrete growth models belonging to the class of the nonlinear molecular beam epitaxy equation, or Villain-Lai-Das Sarma (VLDS) equation. The conserved restricted solid-on-solid model (CRSOS) with maximum heights differences H_m=1 and H_m=2 was analyzed in substrate dimensions d=1 and d=2. The Das Sarma and Tamborenea (DT) model and a competitive model involving random deposition and CRSOS deposition were studied in d=1. For the CRSOS model with H_m=1 we obtain the more accurate estimates of scaling exponents in d=1: roughness exponent alpha = 0.94 +- 0.02 and dynamical exponent z = 2.88 +- 0.04. These estimates are significantly below the values of one-loop renormalization for the VLDS theory, which confirms Janssen's proposal of the existence of higher order corrections. The roughness exponent in d=2 is very near the one-loop result alpha=2/3, in agreement…
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