A self-referred approach to lacunarity

TL;DR

This paper introduces a self-referred method for calculating lacunarity, using the pattern itself as a reference, which improves accuracy especially for finite-size objects, demonstrated through DLA pattern analysis.

Contribution

The paper presents a novel self-referred lacunarity approach that outperforms traditional methods, emphasizing the importance of window shape, particularly circular windows, for better results.

Findings

Self-referred lacunarity improves pattern characterization accuracy.

Circular windows enhance sensitivity in the proposed scheme.

Method is especially effective for finite-size objects.

Abstract

This letter describes an approach to lacunarity which adopts the pattern under analysis as the reference for the sliding window procedure. The superiority of such a scheme with respect to more traditional methodologies, especially when dealing with finite-size objects, is established and illustrated through applications to DLA pattern characterization. It is also shown that, given the enhanced accuracy and sensitivity of this scheme, the shape of the window becomes an important parameter, with advantage for circular windows.