High Quality a-axis outgrowth on c-axis YlCa1-xBa2Cu3O7-d

TL;DR

This paper investigates a novel method to produce well-oriented a-axis outgrowths on c-axis YlCa1-xBa2Cu3O7-d thin films, aiming to improve surface quality for superconducting applications.

Contribution

It introduces an unconventional technique to achieve a-axis outgrowths on c-axis YlCa1-xBa2Cu3O7-d thin films for better surface orientation.

Findings

Successful formation of a-axis outgrowths on c-axis films.

Surface quality improved for electronic applications.

Characterization confirmed the crystallographic orientation.

Abstract

The large amplitude of the high Tc (HTS) superconducting gap is attractive for improved electronic applications. However, the study of such HTS cuprates has uncovered that unlike the s-wave order parameter of the low Tc, an angle dependent dx2-y2 wave function is the dominant order parameter in such compounds. This symmetry causes low energy surface bound states, detrimental for applications, except at (100) oriented surfaces. It is therefore essential to have a smooth and well oriented surface of the crystallographic a-axis (100). In this work we present a study of an unconventional way to attain such surfaces in the form of a-axis outgrowth on a c-axis surface of sputtered Y1-xCaxBa2Cu3O7-d thin film. The grains topography was tested using X-ray, SEM and AFM together with Point Contact and Tunnel Junctions measurements.