Line Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films
E. V. R. Chan
TL;DR
This paper analyzes x-ray magnetic resonance scattering data from CoPt thin films to extract detailed information about their magnetic and structural properties across different photon energies.
Contribution
It introduces a method for analyzing line shape data from x-ray magnetic scattering to understand magnetic properties of thin films.
Findings
Radial and azimuthal intensity patterns are characterized.
Trends in scattering data with increasing photon energy are identified.
The analysis provides insights into magnetic structure variations.
Abstract
Data analysis of the CCD files from x ray magnetic resonance scattering linearly polarized in transmission geometry produces information about the radial and azimuthal intensities. In a series of measurements of increasing photon energies trends in data are analyzed.
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Taxonomy
TopicsSurface Roughness and Optical Measurements · Optical Systems and Laser Technology · Advanced X-ray Imaging Techniques