Measurement of non-Gaussian shot noise: influence of the environment
B. Reulet, L. Spietz, C.M. Wilson, J. Senzier, D.E. Prober

TL;DR
This paper reports the first measurement of the third moment of voltage fluctuations in a conductor, revealing how the electromagnetic environment influences non-Gaussian shot noise, with implications for understanding electronic transport.
Contribution
It introduces a novel measurement technique for the third moment of voltage fluctuations and demonstrates environmental effects on shot noise in tunnel junctions.
Findings
Third moment of voltage fluctuations measured for the first time.
Electromagnetic environment significantly affects shot noise.
Results vary with voltage bias, temperature, and bandwidth.
Abstract
We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on non-superconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.
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