Variable - temperature scanning optical and force microscope

TL;DR

This paper presents a versatile variable-temperature scanning microscope capable of confocal, atomic force, and near-field imaging, operating from 4 to 300 K with integrated optical and force measurement capabilities.

Contribution

It introduces a novel multi-modal microscope design that combines optical and force microscopy in a temperature-controlled environment, enabling simultaneous measurements.

Findings

Operates effectively across 4-300 K temperature range.

Allows simultaneous optical and force measurements.

Supports confocal, AFM, and near-field configurations.

Abstract

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.