Low frequency current noise of the single-electron shuttle

TL;DR

This paper predicts that in a single-electron shuttle system, low frequency current noise is significantly enhanced by amplitude fluctuations of mechanical oscillations, especially near the mechanical instability threshold.

Contribution

It introduces a theoretical prediction of noise enhancement and a peak in low frequency noise at the onset of mechanical instability in single-electron shuttles.

Findings

Low frequency noise is amplified by shuttle oscillation fluctuations.

A pronounced peak in noise occurs at the mechanical instability threshold.

Mechanical-electronic coupling influences current noise characteristics.

Abstract

Coupling between electronic and mechanical degrees of freedom in a single electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low frequency current noise can be enhanced due to amplitude fluctuations of the shuttle oscillations. Moreover, at the onset of mechanical instability a pronounced peak in the low frequency noise is expected.