Response of random field Ising model driven by an external field
Ratnadeep Roy, Purusattam Ray

TL;DR
This paper investigates the zero-temperature 2D random-field Ising model's response to an external field, identifying a critical disorder strength where magnetization jumps abruptly and analyzing domain growth near criticality.
Contribution
It introduces the concept of a critical disorder strength causing a discontinuous magnetization jump and examines domain growth morphology at and away from this critical point.
Findings
Discontinuous magnetization jump at a critical disorder strength
Identification of a critical disorder value for phase transition
Analysis of domain growth patterns near criticality
Abstract
We study the dynamics of spin flipping at first order transitions in zero temperature two-dimensional random-field Ising model driven by an external field. We find a critical value of the disorder strength at which a discontinuous sharp jump in magnetization first occurs. We discuss growth morphology of the flipped-spin domains at and away from criticality.
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