Electron localization in an external electric field

TL;DR

This paper investigates how a weak electric field influences electron localization and weak-localization corrections, identifying two distinct scaling regimes and deriving an explicit crossover temperature expression.

Contribution

It introduces a nonlinear sigma-model approach to analyze the effects of electric fields on electron localization, revealing two scaling regimes and a formula for the crossover temperature.

Findings

Two scaling regimes dominated by temperature and electric field

Explicit expression for the crossover temperature

Electric field impacts weak-localization corrections

Abstract

The impact of a weak electric field on the weak-localization corrections is studied within the framework of a nonlinear sigma-model. Two scaling regimes are obtained. In one, the scaling is dominated by temperature; in the other, by the electric field. An explicit expression is derived for the crossover temperature between the two regimes.