Realization of the anomalous scattering method in crystallography on the basis of the parametric X-ray radiation

TL;DR

This paper demonstrates how parametric X-ray radiation spectra can be used in crystallography to directly measure structure phase information through anomalous scattering, eliminating the need for heavy atom intrusion.

Contribution

It introduces a method utilizing PXR spectra analysis for anomalous scattering in crystallography, applicable to organic compounds with both relativistic and non-relativistic electrons.

Findings

PXR spectra can be used to analyze anomalous dispersion.

The method allows direct phase measurement without heavy atom intrusion.

Applicable to organic compounds with specific electron conditions.

Abstract

Spectra of parametric X-ray radiation (PXR) are considered in the range of anomalous dispersion for one of the atoms in a crystal elementary cell. The PXR spectra are calculated both for the ultra-relativistic and non-relativistic electrons for the specific conditions corresponding to the organic compounds . It is shown that analysis of the RXR angular distribution permits one to realize the method of anomalous scattering for direct measurement of the phases of structure amplitudes without additional isomorphic intrusion of a heavy atom.