Measuring Magnetostriction with an Atomic Force Microscope: Application to Wires in Ballistic Magnetoresistance

TL;DR

This paper introduces a novel atomic force microscopy method to measure magnetostriction in wires under magnetic fields, enabling visualization of strain effects relevant to ballistic magnetoresistance studies.

Contribution

A new AFM-based technique for measuring and visualizing magnetostriction at very small strains, applicable to various metallic wires and films, with implications for magnetoresistance research.

Findings

Measured magnetostriction as small as 5×10⁻⁸.

Results consistent with other measurement methods.

Observed magnetically induced strains affecting magnetoresistance.

Abstract

In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral magnetoelastic shape changes take place on the sample surface when a magnetic field is applied. We have, furthermore, used this technique to observe magnetically induced strains as small as 5*10-8, and have measured Ni, permalloy and commercial Cu wires and films, as well as pure Cu and Pt wires, where results are in agreement with other methods of measurement. The applications are, moreover, relevant to studies of ballistic magnetoresistance, where we can draw conclusions involving the effect of the magnetically induced strains on magnetoresistance measured at the same time as magnestostriction.