Chemically Resolved Electrical Measurements using X-ray Photoelectron Spectroscopy

TL;DR

This paper introduces a new technique called 'chemically resolved electrical measurements' (CREM) that uses energy filtered electrons in X-ray photoelectron spectroscopy to perform direct, chemically specific electrical measurements at sub-surface regions.

Contribution

The paper presents a novel, simple, and general method for chemically resolved electrical measurements using X-ray photoelectron spectroscopy, enabling detailed electrical analysis without traditional metallic contacts.

Findings

Successful demonstration of CREM with sub-surface electrical analysis

Ability to derive I-V curves of self-assembled monolayers without substrate interference

Enhanced in-situ analytical capabilities and top contact performance

Abstract

A novel approach is proposed, where energy filtered electrons, carrying both chemical identity and electrical information, serve as fine and flexible electrodes in direct electrical measurements. The method, termed 'chemically resolved electrical measurements' (CREM), is simple and general, demonstrated here with a slightly modified X-ray photoelectron spectrometer. Selected sub-surface regions are electrically analyzed and I-V curves of self-assembled monolayers, free of substrate and top contact contributions, are derived with no need for improved metallic substrates. Unique electrical information is available with this method, further supported by powerful in-situ analytical capabilities and improved top contact performance.