Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As
B. J. Kirby (1), J. A. Borchers (2), J. J. Rhyne (3), S. G. E. te, Velthuis (4), A. Hoffmann (4), K. V. O'Donovan (2, 5), T. Wojtowicz (6 and, 7), X. Liu (7), W. L. Lim (7), J. K. Furdyna (7) ((1) University of Missouri,, (2) NIST Center for Neutron Research
TL;DR
This study uses polarized neutron reflectometry to analyze how annealing affects the magnetic depth profile of Ga[1-x]Mn[x]As films, revealing increased homogeneity and surface magnetization depletion.
Contribution
It provides new insights into the effects of annealing on magnetic uniformity and Mn redistribution in GaMnAs films.
Findings
Annealing increases total magnetization.
Annealing produces a more homogeneous magnetization distribution.
Surface magnetization depletion is observed in both as-grown and annealed films.
Abstract
We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to increasing total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.
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