Resistive transition in $\pi$-junction superconductors

TL;DR

This paper investigates the resistive transition in inhomogeneous superconductors with random $$ junctions, using numerical simulations of a 3D XY spin glass model to understand critical behavior and compare with experimental data.

Contribution

It introduces a numerical simulation approach to study resistive transitions in $$-junction superconductors, identifying critical exponents and linking them to experimental nonlinear resistivity.

Findings

Resistive transition occurs in the chiral-glass phase at finite temperatures.

Critical exponents are determined through dynamic scaling analysis.

The nonlinear resistivity exponent matches the dynamic critical exponent.

Abstract

The resistivity behavior of inhomogeneous superconductors with random $\pi$ junctions, as in high-$T_c$ materials with d-wave symmetry, is studied by numerical simulation of a three-dimensional XY spin glass model. Above a concentration threshold of antiferromagnetic couplings, a resistive transition is found in the chiral-glass phase at finite temperatures and the critical exponents are determined from dynamic scaling analysis. The power-law exponent for the nonlinear contribution found in recent resistivity measurements is determined by the dynamic critical exponent of this transition.