STM observation of electronic wave interference effect in finite-sized graphite with dislocation-network structures
Yousuke Kobayashi (TITech), Kazuyuki Takai (TITech), Ken-ichi Fukui, (TITech), Toshiaki Enoki (TITech), Kikuo Harigaya (AIST), Yutaka Kaburagi, (Mi-Tech), and Yoshihiro Hishiyama (Mi-Tech)

TL;DR
This study uses STM to observe electronic wave interference patterns in finite-sized graphite with dislocation networks, revealing how these structures influence local electronic states and interference effects.
Contribution
It provides new insights into how dislocation networks in graphite affect electronic wave interference patterns observed via STM.
Findings
Periodic patterns near step edges are influenced by dislocation networks.
Interference effects depend on overlayer height and bias voltage.
Patterns gradually disappear with increasing bias voltage.
Abstract
Superperiodic patterns near a step edge were observed by STM on several-layer-thick graphite sheets on a highly oriented pyrolitic graphite substrate, where a dislocation network is generated at the interface between the graphite overlayer and the substrate. Triangular- and rhombic-shaped periodic patterns whose periodicities are around 100 nm were observed on the upper terrace near the step edge. In contrast, only outlines of the patterns similar to those on the upper terrace were observed on the lower terrace. On the upper terrace, their geometrical patterns gradually disappeared and became similar to those on the lower terrace without any changes of their periodicity in increasing a bias voltage. By assuming a periodic scattering potential at the interface due to dislocations, the varying corrugation amplitudes of the patterns can be understood as changes in LDOS as a result of the…
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