Observation of disorder-induced weakening of electron-phonon interaction in thin noble metal films
J. T. Karvonen, L. J. Taskinen, I. J. Maasilta

TL;DR
This study demonstrates that disorder in thin noble metal films causes a T^4 dependence in electron-phonon interactions, weakening electron-lattice coupling at low temperatures, which differs from previously observed power laws.
Contribution
It provides experimental evidence of a T^4 electron-phonon scattering rate in disordered noble metal films, indicating a disorder-mediated coupling mechanism.
Findings
Electron-phonon scattering rate follows a T^4 dependence.
Disorder causes stronger decoupling of electrons from the lattice.
Contrasts with previous T^3 and T^2 power law observations.
Abstract
We have used symmetric normal metal-insulator-superconductor (NIS) tunnel junction pairs, known as SINIS structures, for ultrasensitive thermometry in the temperature range 50 - 700 mK. By Joule heating the electron gas and measuring the electron temperature, we show that the electron-phonon (e-p) scattering rate in the simplest noble metal disordered thin films (Cu,Au) follows a temperature dependence, leading to a stronger decoupling of the electron gas from the lattice at the lowest temperatures. This power law is indicative e-p coupling mediated by vibrating disorder, in contrast to the previously observed and laws.
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