Demonstration of a 1/4 cycle phase shift in the radiation-induced oscillatory-magnetoresistance in GaAs/AlGaAs devices
R. G. Mani, J. H. Smet, K. von Klitzing, V. Narayanamurti, W. B., Johnson, and V. Umansky

TL;DR
This study investigates the phase of radiation-induced oscillations in GaAs/AlGaAs devices, confirming a consistent 1/4 cycle phase shift and suggesting a slight reduction in effective mass ratio.
Contribution
The paper provides experimental confirmation of a 1/4 cycle phase shift in magnetoresistance oscillations and indicates a small change in effective mass ratio in GaAs/AlGaAs devices.
Findings
Confirmed a $f$-independent 1/4 cycle phase shift.
Suggested a ~2% reduction in effective mass ratio.
Utilized in-situ magnetic field calibration with ESR.
Abstract
We examine the phase and the period of the radiation-induced oscillatory-magnetoresistance in GaAs/AlGaAs devices utilizing in-situ magnetic field calibration by Electron Spin Resonance of DiPhenyl-Picryl-Hydrazal. The results confirm a -independent 1/4 cycle phase shift with respect to the condition for , and they also suggest a small ( 2%) reduction in the effective mass ratio, , with respect to the standard value for GaAs/AlGaAs devices.
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