Electron-Phonon Scattering in Metallic Single-Walled Carbon Nanotubes
Ji-Yong Park, Sami Rosenblatt, Yuval Yaish, Vera Sazonova, Hande, Ustunel, Stephan Braig, T. A. Arias, Piet W. Brouwer, and Paul L. McEuen

TL;DR
This paper investigates electron-phonon scattering in metallic single-walled carbon nanotubes by measuring resistance scaling, revealing scattering mechanisms and mean free paths at different bias regimes.
Contribution
It provides experimental measurements of scattering rates and mean free paths, confirming theoretical models for phonon scattering in nanotubes.
Findings
Scattering rates match acoustic phonon models at low bias.
High bias scattering aligns with zone boundary/optical phonon models.
Mean free paths are quantified for different bias regimes.
Abstract
Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the same nanotube with length in the low and high bias regimes, the mean free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic phonon scattering at low biases and zone boundary/optical phonon scattering at high biases.
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