A Model for Striped Growth

TL;DR

This paper presents a new model for striped pattern growth with defect dynamics, revealing distinct defect types and growth laws differing from traditional point defect systems, supported by analysis of characteristic lengths.

Contribution

Introduces a novel model for striped pattern growth that captures defect behavior and growth laws distinct from classical models like Swift-Hohenberg.

Findings

Identifies two characteristic lengths: scaling length and domain wall width.

Finds growth law exponent exceeds 1/2, indicating faster domain growth.

Shows the model produces a different defect mixture during phase ordering.

Abstract

We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.