Electronic Transport through YBCO Grain Boundary Interfaces between 4.2 K and 300 K

TL;DR

This study investigates the temperature-dependent electrical resistance of YBCO grain boundary junctions between 4.2 K and 300 K, revealing linear resistance decrease and behavior at the superconducting transition.

Contribution

It provides detailed measurements of YBCO grain boundary resistance across a wide temperature range, highlighting the linear decrease and transition behavior.

Findings

Resistance decreases linearly from 100 K to 300 K

At Tc, normal and superconducting state resistances converge

Resistance drops by a factor of four between 100 K and 300 K

Abstract

The current-induced dissipation in YBCO grain boundary tunnel junctions has been measured between 4.2 K and 300 K. It is found that the resistance of 45 degree (100)/(110) junctions decreases linearly by a factor of four when their temperature is increased from 100 K to 300 K. At the superconducting transition temperature Tc the grain boundary resistance of the normal state and of the superconducting state extrapolate to the same value.