Bolometric technique for high-resolution broadband microwave spectroscopy of ultra-low-loss samples
P.J. Turner, D.M. Broun, Saeid Kamal, M.E. Hayden, J.S. Bobowski, R., Harris, D.C. Morgan, J.S. Preston, D.A. Bonn, and W.N. Hardy

TL;DR
This paper introduces a new low-temperature bolometric technique for high-resolution broadband microwave spectroscopy of ultra-low-loss samples, enabling precise measurements of microwave surface resistance across frequencies.
Contribution
The paper presents a novel non-resonant bolometric method with in-situ calibration for accurate microwave surface resistance measurements of small, low-absorption samples at cryogenic temperatures.
Findings
Minimum detectable power at 1.3 K is 1.5 pW.
Surface resistance sensitivity is approximately 1 micro-ohm.
Method allows temperature-dependent absorption measurements.
Abstract
A novel low temperature bolometric method has been devised and implemented for high-precision measurements of the microwave surface resistance of small single-crystal platelet samples having very low absorption, as a continuous function of frequency. The key to the success of this non-resonant method is the in-situ use of a normal metal reference sample that calibrates the absolute rf field strength. The sample temperature can be controlled independently of the 1.2 K liquid helium bath, allowing for measurements of the temperature evolution of the absorption. However, the instrument's sensitivity decreases at higher temperatures, placing a limit on the useful temperature range. Using this method, the minimum detectable power at 1.3 K is 1.5 pW, corresponding to a surface resistance sensitivity of 1 for a typical 1 mm1 mm platelet sample.
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